Online Lecture by dr. Baptiste Gault

Introduction to atom probe tomography: performance and opportunities in characterizing microstructures

Speaker: dr. Baptiste Gault, Max-Planck-Institut für Eisenforschung, Düsseldorf, Germany.

Title: 
Introduction to atom probe tomography: performance and opportunities in characterizing microstructures.

Abstract:
Atom probe tomography is a burgeoning microscopy and microanalysis technique, stemming from field-ion microscopy, and allowing for compositional mapping of solid materials with sub-nanometre resolution and sensitivity in the range of tens of parts-per-million across all elements. In this lecture, I will go back to the basics of the technique, introduce the fundamental principles that enable the analysis but also limit the technique’s performance. I will showcase examples of applications to the compositional analyses of a range of microstructural features including grain and phase boundaries, structural defects and secondary phases, in relation to the host materials’ macroscopic physical properties.

The session was chaired by prof. Joakim Odqvist (KTH Royal Institute of Technology).